International Journal Published in Reliability Engineering & System Safety
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작성자 최고관리자 작성일 15-05-24 15:52 조회 288회본문
- Title: An Empirical Model to Describe Performance Degradation for Warranty Abuse Detection in Portable Electronics
- Authors: Hyunseok Oh, Seunghyuk Choi, Keunsu Kim, Byeng D. Youn, and Michael Pecht
- Journal: Reliability Engineering & System Safety (SCI, IF: 2.048, Rank: 10.1%)