FBG-SEANet: Frequency-Band Graph-based Sensor Fusion with Sensitivity-aware Energy Assist Network for Machinery System Fault Diagnosis

Sang Kyung Lee, Hyeongmin Kim, Minseok Chae, Hansoo Kim, Joonho Yang, Heonjun Yoon*, and Byeng D. Youn* Engineering Applications of Artificial Intelligence , SCIE (IF: 8.0, Rank: 2.6%), Under Revision

Physics-guided Deep Ensemble Learning for the Remaining Useful Life Prediction of Machine Tools Using Kernel Density Estimation

Yong Chae Kim, Bongmo Kim, MinJung Kim, Sang Kyung Lee, Joon Ha Jung*, and Byeng D. Youn* International Journal of Precision Engineering and Manufacturing-Green Technology, SCIE (IF: 5.6, Rank: 11.8%), Online Published

Multi-scale Signal Transformer with Signal Processing-Based Attention Interpretation for Fault Diagnosis of Rotating Machinery under Variable Speed Conditions

Sungjong Kim, Seungyun Lee, Jiwon Lee, Minjae Kim, Heonjun Yoon*, and Byeng D. Youn* Reliability Engineering & System Safety, SCIE (IF: 11.0, Rank: 1.4%), 2026-07, Vol. 271, pp. 112243

An Adapter-Enhanced, Fourier Feature Deep Operator Network for Fault Severity Estimation of Stator Inter-Turn Short Circuits in Induction Motors

Minseok Chae, Hyeongmin Kim, Sang Kyung Lee, Hansoo Kim, Joonho Yang, Heonjun Yoon*, and Byeng D. Youn* Engineering Applications of Artificial Intelligence , SCIE (IF: 8.0, Rank: 2.6%), 2026-04, Vol. 170, pp. 114197

ARDiff: An Adaptive Reverse-Step Diffusion Framework for Unsupervised Vibration Signal Denoising with Frequency Attention

Juhyun Kim, Yong Chae Kim, Jongwha Baek, Jinwook Lee, Joon Ha Jung*, and Byeng D. Youn* Mechanical Systems and Signal Processing, SCIE (IF: 8.9, Rank: 3.0%), 2026-01, Vol. 244, pp. 113726

Battery Maximum Available Capacity Estimation in Partial Charge Curve with Current Charge State Invariant Feature

Bongmo Kim, Yong Chae Kim, Hyunhee Choi, Gyeong Ryun Gwon, Taejin Kim*, and Byeng D. Youn* Journal of Energy Storage, SCIE (IF: 9.8, Rank: 14.0%), 2025-12, Vol. 138, pp. 118726

Transformer-Based Prediction of Dispersion Relation and Transmittance in Phononic Crystals

Donghyu Lee, Taehun Kim, Ju Hwan Han, Sayhee Kim, Byeng D. Youn*, and Soo-Ho Jo* International Journal of Mechanical Sciences, SCIE (IF: 9.4, Rank: 2.5%), 2025-12, Vol. 307, pp. 110880

Steering of Multiple Defect Bands in One-dimensional Phononic Crystals with Segmented Piezoelectric Defects

Soo-Ho Jo¹, Taehun Kim¹, Donghyu Lee, Pengpeng Yu, Junlei Wang, Byeng D. Youn, and Heonjun Yoon* Journal of Physics D-Applied Physics, SCIE (IF: 3.2, Rank: 37.7%), 2025-11, Vol. 58, No. 46 pp. 465501

Deep Learning-Enabled Diagnosis of Abdominal Aortic Aneurysm Using Pulse Volume Recording Waveforms: An In-Silico Study

Sina Masoumi Shahrbabak, Byeng D. Youn, Hao-Min Cheng, Chen-Huan Chen, Shih-Hsien Sung, Ramakrishna Mukkamala, and Jin-Oh Hahn* Sensors, SCIE (IF: 3.5, Rank: 23.8%), 2025-11, Vol. 25, No. 21 pp. 6678

Spectral Kurtosis Attention Network (SKAN): Synergizing Signal Processing and Deep Learning for Fault Diagnosis of Rolling Element Bearings

Jongmin Park, Jinoh Yoo, Taehyung Kim, Minjung Kim, Jonghyuk Park, Jong Moon Ha*, and Byeng D. Youn* Expert Systems with Applications, SCIE (IF: 7.5, Rank: 6.1%), 2025-11, Vol. 292, pp. 128581

Deep Learning-based Cross-domain Tacholess Instantaneous Speed Estimation of Rotating Machinery with a Selective Multi-order Frequency Module

Minjung Kim, Yong Chae Kim, Jinoh Yoo, Jongmin Park, Taehyung Kim, Jong Moon Ha*, and Byeng D. Youn* IEEE Sensors Journal, SCIE (IF: 4.5, Rank: 19.6%), 2025-10, Vol. 25, No. 20 pp. 37810-37820

Toward Robust Structure Function-Based Thermal Analysis: Quantitative Metrics for Semiconductor Packaging Evaluation

Wonbin Song, Guesuk Lee*, and Byeng D. Youn* Microelectronics Reliability, SCIE (IF: 1.9, Rank: 61.6%), 2025-10, Vol. 173, pp. 115867

Inverse Design of Defective Phononic Crystals Using Surrogate-assisted Conditional Generative Adversarial Network

Donghyu Lee, Taehun Kim, Byeng D. Youn*, and Soo-Ho Jo* Journal of Computational Design and Engineering, SCIE (IF: 6.1, Rank: 6.6%), 2025-07, Vol. 12, No. 7, pp. 129-147

FL-SSDAN: Fleet-Level Semi-Supervised Domain Adaptation Network for Fault Diagnosis of Overhead Hoist Transports

Chaehyun Suh¹, Hyeongmin Kim¹, Chan Hee Park, Minseok Chae, Joung Taek Yoon, Ilkyu Lee, Heonjun Yoon*, and Byeng D. Youn* Journal of Computational Design and Engineering, SCIE (IF: 6.1, Rank: 6.6%), 2025-07, Vol. 12, No. 7, pp. 49-60

Fault-relevance-based, multi-sensor information integration framework for fault diagnosis of rotating machineries

Sungjong Kim, Seungyun Lee, Jiwon Lee, Minjae Kim, Su J. Kim, Heonjun Yoon*, and Byeng D. Youn* Mechanical Systems and Signal Processing, SCIE (IF: 8.9, Rank: 3.0%), 2025-06, Vol. 232, pp. 112742

Physics-informed Gaussian Process Probabilistic Modeling with Multi-source Data for Prognostics of Degradation Processes

Chen Jiang, Teng Zhong, Hyunhee Choi, and Byeng D. Youn* Reliability Engineering & System Safety, SCIE (IF: 11.0, Rank: 1.4%), 2025-06, Vol. 258, pp. 110893