Conference

Industry Forum: Monitoring, Diagnostics, and Prognostics for Manufacturing Operations

Author

Junmin Lee, Chan Hee Park, Giljun Ahn, Jun Young Lee, Insun Shin, Kyusung Jung, Byeng D. Youn, Hyun Soo Jang, Daeil Kwon and Joo-Ho Choi

Date

2018-05-09

Presentation Type

Oral

Link

http://www.nist.gov/news-events/events/2018/05/industry-forum-monitori… 336회 연결