International Fault Diagnosis Device of Transformer and Fault Diagnosis Method Using the Same
본문
- Patent Scope
- International
- Country
- Patent Cooperation Treaty
- Related area
- Prognostics and Health Management
- Inventors
- Byeng D. Youn, Sunuwe Kim, Soo-Ho Jo, Jongmin Park, and Wongon Kim
- Classification
- Patent Application
- Patent No.
- PCT/KR2021/013531
- Date
- 2021-10-01