International Apparatus and Method for Failure Prognosis in Inverter
본문
- Patent Scope
- International
- Country
- Germany
- Related area
- Prognostics and Health Management
- Inventors
- Deog Hyeon Kim, Yong Un Cho, Yongchae Lim, Byeng D. Youn, Hyunseok Oh, and Junmin Lee
- Classification
- Patent Application
- Patent No.
- 10-2017-2078065
- Date
- 2017-05-09