International Transformer Malfunction Diagnosis Device and Malfuction Diagnosis Method Using Same
본문
- Patent Scope
- International
- Country
- United States of America
- Related area
- Prognostics and Health Management
- Inventors
- Byeng D. Youn, Sunuwe Kim, Soo-Ho Jo, Jongmin Park, and Wongon Kim
- Classification
- Patent Application
- Patent No.
- 18/260090
- Date
- 2023-06-30