A New Calibration Metric that Considers Statistical Correlation: Marginal Probability and Correlation Residuals
Wongon Kim, Heonjun Yoon*, Guesuk Lee, Taejin Kim, and Byeng D. Youn*
Reliability Engineering & System Safety,
2020-03, SCIE (IF: 11.0, Rank: 1.4%) , Vol. 195, pp. 106677