A New Parameter Repurposing Method for Parameter Transfer with Small Dataset and Its Application in Fault Diagnosis of Rolling Element Bearings

Hyunjae Kim and Byeng D. Youn* IEEE Access, 2019-03, SCIE (IF: 3.4, Rank: 34.5%) , Vol. 7, pp. 46917-46930

Test Scheme and Degradation Model of Accumulated Electrostatic Discharge (ESD) Damage for Insulated Gate Bipolar Transistor (IGBT) Prognostics

Junmin Lee, Hyunseok Oh*, Chan Hee Park, Byeng D. Youn*, and Bongtae Han IEEE Transactions on Device and Materials Reliability, 2019-03, SCIE (IF: 2.5, Rank: 46.7%) , Vol. 19, No. 1, pp. 233-241

Two-dimensional Octagonal Phononic Crystals for Highly Dense Piezoelectric Energy Harvesting

Choon-Su Park¹, Yong Chang Shin¹, Soo-Ho Jo, Heonjun Yoon, Wonjae Choi, Byeng D. Youn*, and Miso Kim* Nano Energy, 2019-03, SCIE (IF: 16.8, Rank: 5.3%) , Vol. 57, pp. 327-337

A Positive Energy Residual (PER) based Planetary Gear Fault Detection Method under Variable Speed Conditions

Jungho Park, Moussa Hamadache, Jong M. Ha, Yunhan Kim, Kyumin Na, and Byeng D. Youn* Mechanical Systems and Signal Processing, 2019-02, SCIE (IF: 7.9, Rank: 2.5%) , Vol. 117, pp. 347-360

System Reliability Analysis of Piezoelectric Vibration Energy Harvesting Considering Multiple Safety Events Under Physical Uncertainty

Heonjun Yoon and Byeng D. Youn* Smart Materials and Structures, 2019-02, SCIE (IF: 3.7, Rank: 21.7%) , Vol. 28, No. 2, pp. 025010

Uncertainty Characterization Under Measurement Errors Using Maximum Likelihood Estimation: Cantilever Beam End-to-End UQ Test Problem

Taejin Kim¹, Guesuk Lee¹, and Byeng D. Youn* Structural and Multidisciplinary Optimization, 2019-02, SCIE (IF: 3.6, Rank: 17.0%) , Vol. 59, pp. 323–333