Physics-of-Failure, Condition Monitoring, and Prognostics of Insulated Gate Bipolar Transistor Modules: A Review
Hyunseok Oh, Bongtae Han*, Patrick McCluskey, Changwoon Han, and Byeng D. Youn
IEEE Transactions on Power Electronics,
2015-05, SCIE (IF: 6.6, Rank: 10.9%) , Vol. 30, No. 5, pp. 2413-2426