Publication

Hyperautonomy Artificial Intelligence Lab

Designing Accelerated Life test for a Liquid Damage Indicator to Detect Warranty Abuse in Portable Electronics

본문

Conference
3rd International Conference on Materials and Reliability
Author
Keunsu Kim, Byeng D. Youn, Hyunseok Oh, Seunghyuk Choi, and Michael Pecht
Date
2015-11-25
Presentation Type
Oral

d82a66e450e665cd6e4df5878c378e7a_1718083748_986.png