"Failure Precursor Identification and Degradation Modeling for Insulated Gate Bipolar Transistors Subjected to Electrical Stress"
Junmin Lee, Hyunseok Oh, Chan Hee Park, Byeng D. Youn, Deog Hyeon Kim, Byung Hwa Kim, and Yong Un Cho
Conference : Annual Conference of the Prognostics and Health Management Society 2016
2016-10-03