Failure Precursor Identification and Degradation Modeling for Insulated Gate Bipolar Transistors Subjected to Electrical Stress > International | 서울대학교 초자율화 인공지능 연구실

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Hyperautomation Artificial Intelligence

Failure Precursor Identification and Degradation Modeling for Insulated Gate Bipolar Transistors Subjected to Electrical Stress

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Conference: Annual Conference of the Prognostics and Health Management Society 2016

Author: Junmin Lee, Hyunseok Oh, Chan Hee Park, Byeng D. Youn, Deog Hyeon Kim, Byung Hwa Kim, and Yong Un Cho

Date: 2016-10-03

Presentation Type: Oral

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