International Transformer Malfunction Diagnosis Device and Malfuction Diagnosis Method Using Same
본문
- Patent Scope
- International
- Country
- United States of America
- Inventors
- Byeng D. Youn, Sunuwe Kim, Soo-Ho Jo, Jongmin Park, and Wongon Kim
- Classification
- Patent Application
- Patent No.
- 12,631,615
- Date
- 2026-05-19