Publication

Hyperautonomy Artificial Intelligence Lab

International Transformer Malfunction Diagnosis Device and Malfuction Diagnosis Method Using Same

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Patent Scope
International
Country
United States of America
Related area
Prognostics and Health Management
Inventors
Byeng D. Youn, Sunuwe Kim, Soo-Ho Jo, Jongmin Park, and Wongon Kim
Classification
Patent Application
Patent No.
18/260090
Date
2023-06-30