International Transformer Malfunction Diagnosis Device and Malfunction Diagnosis Method Using Same
본문
- Patent Scope
- International
- Country
- United States of America
- Inventors
- Byeng D. Youn, Sunuwe Kim, Soo-Ho Jo, Jongmin Park, and Wongon Kim
- Patent No.
- 18/260090
- Date
- 2023-06-30