On the Orthogonal Similarity Transformation (OST)-Based Sensitivity Analysis Method for Robust Topology Optimization under Loading Uncertainty: A Mathematical Proof and Its Extension

Junpeng Zhao, Byeng D. Youn*, Heonjun Yoon, Zhifang Fu, and Chunjie Wang Structural and Multidisciplinary Optimization, 2018-07, SCIE (IF: 4.0, Rank: 16.9%) , Vol. 58, pp. 51–60

A Comprehensive Study on Enhanced Optimization-Based Model Calibration Using Gradient Information

Guesuk Lee, Guilian Yi, and Byeng D. Youn* Structural and Multidisciplinary Optimization, 2018-05, SCIE (IF: 4.0, Rank: 16.9%) , Vol. 57, pp. 2005–2025

Scalable and Unsupervised Feature Engineering Using Vibration-Imaging and Deep Learning for Rotor System Diagnosis

Hyunseok Oh¹, Joon Ha Jung¹, Byung Chul Jeon, and Byeng D. Youn* IEEE Transactions on Industrial Electronics, 2018-04, SCIE (IF: 7.2, Rank: 4.4%) , Vol. 65, No. 4, pp. 3539-3549

Autonomous Health Management for PMSM Rail Vehicles through Demagnetization Monitoring and Prognosis Control

Gang Niu*, Junjie Jiang, Byeng D. Youn, and Michael Pecht ISA Transactions, 2018-01, SCIE (IF: 6.5, Rank: 5.4%) , Vol. 72, pp. 245-255

Time-Varying Output Performances of Piezoelectric Vibration Energy Harvesting under Nonstationary Random Vibrations

Heonjun Yoon, Miso Kim*, Choon-Su Park, and Byeng D. Youn* Smart Materials and Structures, 2018-01, SCIE (IF: 2.2, Rank: 46.4%) , Vol. 27, No. 1, pp. 015004

Assembly Yield Prediction of Plastically Encapsulated Packages with a Large Number of Manufacturing Variables by Advanced Approximate Integration Method

Hsiu-Ping Wei, Bongtae Han*, Byeng D. Youn, Hyuk Shin, Ilho Kim, and Hojeong Moon Microelectronics Reliability, 2017-11, SCIE (IF: 1.9, Rank: 61.6%) , Vol 78, pp. 319-330

A Newly Formulated Resilience Measure that Considers False Alarms

Joung Taek Yoon, Byeng D. Youn*, Minji Yoo, and Yunhan Kim Reliability Engineering & System Safety, 2017-11, SCIE (IF: 11.0, Rank: 1.4%) , Vol. 167, pp. 417-427

Modeling and Assessment of Partially Debonded Piezoelectric Sensor in Smart Composite Laminates

Asif Khan, Heung Soo Kim*, Byeng D. Youn International Journal of Mechanical Sciences, 2017-10, SCIE (IF: 9.4, Rank: 2.5%) , Vol 131-132, pp. 26-36

Omnidirectional Regeneration (ODR) of Proximity Sensor Signals for Robust Diagnosis of Journal Bearing Systems

Joon Ha Jung, Byung Chul Jeon, Byeng D. Youn*, Myungyon Kim, Donghwan Kim, and Yeonwhan Kim Mechanical Systems and Signal Processing, 2017-06, SCIE (IF: 8.9, Rank: 3.0%) , Vol. 90, pp. 189–207

Classification of Operating Conditions of Wind Turbines for a Class-wise Condition Monitoring Strategy

Jong M. Ha, Hyunseok Oh*, Jungho Park, and Byeng D. Youn* Renewable Energy, 2017-04, SCIE (IF: 9.1, Rank: 17.2%) , Vol. 103, pp. 594-605

Bivariate Lifetime Model for Organic Light-Emitting Diodes

Dae Whan Kim, Hyunseok Oh, Byeng D. Youn*, and Dongil Kwon IEEE Transactions on Industrial Electronics, 2017-03, SCIE (IF: 7.2, Rank: 4.4%) , Vol. 64, No. 3, pp. 2325-2334

Model-Based Fault Diagnosis of a Planetary Gear: A Novel Approach Using Transmission Error

Jungho Park, Jong M. Ha, Hyunseok Oh*, Byeng D. Youn*, Joo-Ho Choi, and Nam Ho Kim IEEE Transactions on Reliability, 2016-12, SCIE (IF: 5.7, Rank: 9.0%) , Vol. 65, No. 4, pp. 1830-1841

A Systematic Approach for Model Refinement Considering Blind and Recognized Uncertainties in Engineered Product Development

Hyunseok Oh, Jisun Kim, Hyejeong Son, Byeng D. Youn*, and Byung C. Jung Structural and Multidisciplinary Optimization, 2016-12, SCIE (IF: 4.0, Rank: 16.9%) , Vol. 54, pp. 1527–1541

An Online-Applicable Model for Predicting Health Degradation of PEM Fuel Cells with Root Cause Analysis

Taejin Kim, Hyunseok Oh, Hyunjae Kim, and Byeng D. Youn* IEEE Transactions on Industrial Electronics, 2016-11, SCIE (IF: 7.2, Rank: 4.4%) , Vol. 63, No. 11, pp. 7094-7103

A Comprehensive Survey on Topology Optimization of Phononic Crystals

Guilian Yi and Byeng D. Youn* Structural and Multidisciplinary Optimization, 2016-11, SCIE (IF: 4.0, Rank: 16.9%) , Vol. 54, pp. 1315–1344

Fault Log Recovery Using an Incomplete-data-trained FDA Classifier for Failure Diagnosis of Engineered Systems

Hyunjae Kim, Jong M. Ha, Jungho Park, Sunuwe Kim, Keunsu Kim, Beom Chan Jang, Hyunseok Oh*, and Byeng D. Youn International Journal of Prognostics and Health Management, 2016-04, IF: 0.0, Rank: 0.0% , Vol. 7, No. 1, pp. 1-10